X-RAY DEVICE FOR INSPECTING THICKNESS OF MULTILAYER COATINGS OF CYLINDRICAL ITEMS Russian patent published in 2005 - IPC

FIELD: non-destructive inspection.

SUBSTANCE: primary and secondary n detectors are made of multielement converting elements made of materials having different atomic numbers. Materials are disposed in detectors subsequently starting from lower number to higher ones. Converting elements of primary and secondary n detectors are electrically connected with inputs of (1+n) analog-to-digital converters. Primary detector is rigidly fastened to collimator of radiation source and is turned to item with side having been made of material with higher atomic number. Secondary n detectors are turned to item with sides having lower atomic number. Points of stop of discrete displacement of radiator with primary detector along the rail are coincided with radial directions being placed in the middle of radial directions which form sectors and cross the items at lateral cross-section through their longitudinal axis and centers of secondary n detectors. Value of equivalent atomic number of any layer of coating is calculated from algorithm introduced into processor.

EFFECT: improved precision of inspection.

1 dwg