X-RAY DEVICE FOR INSPECTION OF THICKNESS OF BIMETAL BAND'S THICKNESS Russian patent published in 2006 - IPC G01B15/02 

FIELD: nondestructive inspection.

SUBSTANCE: device has X-ray radiation source provided with collimator, first X-ray chamber, bimetal band to be inspected disposed between radiation source and first chamber, second X-ray chamber, processor and registrar. First chamber is disposed in direct flux of X-ray radiation. Second chamber is disposed in flux being reflected from structure of band's material. Second chamber is equipped with collimator and scanning actuating mechanism which provides reception of information on top, internal and lower boundaries of structure of band material at output of second chamber. Radiation source's and second chamber's collimators are made in form of narrow slits which provided thin-flat shape in width to radiated direct X-ray flux and to reflected X-ray flux which is received by second chamber. Width of flux is equal or excess width of band. Thin-flat flux of radiation source is directed normally to surface of band to be inspected and it is oriented along cross-section of band. Second chamber has collimator disposed normally to X-ray flux reflected from band at distance from line of crossing of band with direct flux being equal or shorter than 0,5 m. Slit of collimator of the second chamber is oriented in parallel to slit of collimator of radiation source. Actuating mechanism has to reversible engine which is cinematically connected with second chamber to provide turn of the second chamber relatively line of crossing of direct radiation flux and band to ne inspected, in plane formed by longitudinal axes of symmetry of direct and reflected fluxes and of band to be inspected.

EFFECT: improved resolving power; improved precision of measurement.

1 dwg