X-RAY METHOD FOR DETERMINATION OF PRODUCT PARAMETERS Russian patent published in 2007 - IPC G01B15/02 

FIELD: X-ray methods for measurement of parameters of a controlled metal product, applicable at control of plates, pipe-lines, units of a complex-shaped geometry and other products.

SUBSTANCE: the method consists in disposition of the product normally to the flux of X-ray radiation, X-ray test of the product by the flux of X-ray radiation having passed through the first two-layer detector, after the test the flux is detected by means of the second two-layer detector and the third detector made in the form of a multielement matrix, the electric signals formed as a result of detection are numbered, processed, and an X-ray exposition of the controlled product is obtained, them the current and the effective energy of the X-ray radiation are changed in succession with the aid of an X-ray radiation source, the procedure of detection of the X-ray radiation and subsequent processing of the electric signal from the output of the detectors is repeated, and its own exposition of the X-ray radiation is determined for each parameter of the X-ray radiation, the parameters of the controlled product are determined on the basis of the obtained expositions.

EFFECT: expanded dynamic range of measurement, as well as expanded energy resolution of scanning of the controlled product.

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