DEVICE X-RAY INSPECTION OF THICKNESS OF LAYERS OF BIMETAL BAND Russian patent published in 2006 - IPC G01B15/02 G01N23/83 

FIELD: test and measuring technique.

SUBSTANCE: device can be used for measuring thickness of layers of bimetal band, which band is used in thermometers, thermal controllers. Method can be used in mechanical engineering, power engineering and other branches of industry. Device has digital calculator. Sizes of slots of collimators in radiator and in the second chamber are made in cross-sectional cut within 2-4 mm and in longitudinal cut of (1.1-1.2)d, where d is width of band in cross-sectional cut. Slots are oriented in parallel to each other and they focused with their apertures to the same cross-section of band. Ability of scanning within sector of sign-polar angle of +-α is provided for the second chamber inside plane being formed by normal line of direct radiation flux, which normal line is brought into coincidence with longitudinal axis of symmetry of direct flux, and of longitudinal axis of band, which axis crosses between its layers and which axis crosses longitudinal axis of symmetry of direct flux within angle which closes width of aperture of direct X-ray flux at cross-sectional cut of band, which cross-sectional cut is radiated by direct flux. Output of second chamber is connected with input of digital calculator which has output connected with input of processor.

EFFECT: high geometric resolution of material of bimetal band's layers with different structure and density of materials.

2 dwg