FIELD: test and measurement equipment; solid-state physics.
SUBSTANCE: method can be used for measuring parameters of oxygen diffusion in solid polycrystalline materials. Method includes removal of thin surface layers from sample till achieving value of energy of activation of electric conductance in surface layer of sample of value of 0,19-0,20 eV and subsequent heating of material. Then material is sustained in warm state. After it the sample is subject to cooling and angle lapping is formed onto surface of the sample at angle of 5-6 deg. Remote distribution of energy of activation of electric conductivity is measured due to measuring energy of activation of electric conductivity in different parts of surface of angle lapping. Factors of diffusion are determined by approximating of distribution by the relation which ties value of energy of activation of electric conductivity with concentration of diffused ions in form of Fick relation characterized by corresponding boundary conditions. The procedure is repeated for different temperatures of heating and diffusion factor temperature dependence is built. Diffusion constants are found from results of approximation of mentioned relation by law of Arrenius.
EFFECT: reduced labor input; improved precision of measurement.
1 tbl, 4 dwg
Title | Year | Author | Number |
---|---|---|---|
METHOD DETERMINING DIFFUSION CONSTANTS IN POLYCRYSTALLINE BODIES | 1999 |
|
RU2169914C2 |
METHOD FOR DETERMINING DIFFUSION CONSTANTS IN POLYCRYSTALLINE MATERIALS | 2005 |
|
RU2289118C1 |
METHOD FOR DEFINING DIFFUSION CONSTANTS IN POLYCRYSTALLINE MATERIALS | 2007 |
|
RU2338180C1 |
METHOD OF LAYER-BY-LAYER ANALYSIS OF THIN FILMS | 2002 |
|
RU2229116C1 |
METHOD OF DETERMINING DIFFUSION COEFFICIENT IN POWDER MATERIALS AND METHOD OF DETERMINING THICKNESS AND INDEX OF COATING INTEGRITY ON PARTICLES OF POWDER MATERIALS | 2012 |
|
RU2522757C1 |
METHOD OF DETERMINING DIFFUSION CONSTANTS IN CRYSTALLINE BODIES WITH IMPURITY INHOMOGENEITY | 0 |
|
SU1548709A1 |
METHOD OF DETERMINING DIFFUSION COEFFICIENT FOR SEMICONDUCTORS | 0 |
|
SU1053189A1 |
METHOD OF DETERMINING DIFFUSION COEFFICIENT OF DOPANT ATOMS IN SEMICONDUCTOR | 2009 |
|
RU2408952C1 |
DIFFUSION COEFFICIENT DETERMINATION METHOD | 0 |
|
SU1117491A1 |
METHOD OF FORMING OF ULTRAFINE STRUCTURE IN NON-FERROUS ALLOYS BASED ON COPPER AND ALUMINIUM (VERSIONS) | 2013 |
|
RU2551041C2 |
Authors
Dates
2005-09-20—Published
2004-04-13—Filed