METHOD FOR TESTING VACUUM SWITCHES DURABILITY AGAINST THROUGH SHORT-CIRCUIT CURRENTS Russian patent published in 2006 - IPC G01R31/327 

Abstract RU 2269140 C1

FIELD: electronic engineering, primarily, technology for testing vacuum switches.

SUBSTANCE: method includes, during process of letting current through switch at predetermined parameters, performing tests during pressing in of contacts of arc-reducing chambers, decreased for value of expected loss of contacts pressure.

EFFECT: increased reliability.

1 dwg

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RU 2 269 140 C1

Authors

Pertsev Aleksej Aleksandrovich

Belotelov Viktor Petrovich

Ryl'Skaja Lidija Aleksandrovna

Dates

2006-01-27Published

2004-07-09Filed