FIELD: analog-digital computer engineering; reactivity measurement device verification and on-the-fly check of its operability.
SUBSTANCE: proposed method includes forming of first data array which corresponds to changes of reactor's power parameter for a given reactivity, normalization to a given number of decades of the first data array, saving in the storage device of the second data array which is derived from normalization, with the first K decades of power parameter changes being used when forming the data arrays. By values of the second array control action is formed. Forming is executed one time by values of first K decades and N-K times by values of Kth decade, with simultaneously changing level of controlling voltage and impedance value of current-generating resistor-imitator in the end of decades - first in the end of each of the first K-1 decades and then in the end of Kth decade in the quantity of N-K+1, where K depends on the value of modeled reactivity.
EFFECT: decreased storage capacity in simulator program control unit.
6 dwg, 2 tbl
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Authors
Dates
2006-11-20—Published
2005-06-20—Filed