INTERFEROMETRIC MODE OF MEASURING THE THICKNESS AND THE VALUES OF REFRACTION OF TRANSPARENT OBJECTS Russian patent published in 2007 - IPC G01B11/02 G01N21/45 

FIELD: the invention refers to non-invasive optical methods of measuring the physical parameters of transparent objects.

SUBSTANCE: with the aid of a source of light they form low coherent radiation directed into a double-reflecting beam interferometer. The low coherent optical radiation coming out of the double-reflecting beam interferometer is introduced into a fiber-optic transmitting line. The coming out low coherent optical radiation is divided on a supporting and measuring beams. The supporting and the measuring beams are directed along the supporting and the measuring passes. The low coherent optical radiation passed along the supporting optical motion is mixed with the low coherent optical radiation passed along the measuring pass. The intensity of the received low coherent optical radiation is converted into an electrical signal with the aid of a photo converter. The initial value of optical difference of the pass for the beams in the double-reflecting beam interferometer is installed. The investigated object is placed on the optical pass of the measuring beam. The change relatively to the initial value of the optical difference of the pass for the beams of the double-reflecting beam interferometer is measured. The optical difference of the pass for the beams of the double-reflecting beam interferometer is measured.

EFFECT: simplification of apparatus realization of the mode at simultaneous increase of accuracy of measuring.

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