X-RAY SPECTROPOLARIMETER Russian patent published in 2008 - IPC G01T1/32 

FIELD: physics of electromagnetic radiation, possible use for measuring x-ray radiation during high temperature plasma research, interaction of high energy particles and substances, in medicine, in x-ray structural analysis, in radiography, x-ray microscopy, production of microchips.

SUBSTANCE: claimed x-ray spectropolarimeter contains a crystal for extracting polarization component of x-ray radiation and detector for registration of x-ray radiation, while the angle between measured x-ray radiation and line of intersection of reflecting atomic surfaces of crystal with two systems of identical reflecting atomic planes, positioned at an angle of 120°, is 54,7°, and detectors for registration of reflected x-ray radiation are positioned in two mutually perpendicular planes, which pass through point in which x-ray radiation being measured falls into the crystal.

EFFECT: expanded functional capabilities, namely, production of two components of x-ray radiation polarization simultaneously.

1 dwg