FIELD: mining automatics. SUBSTANCE: parallel light flux is directed to mirror with polarization coating made of amorphous semiconductor. Light flux reflected from mirror is passed to photoreceiver through linear polarizer. The latter is rotated till maximum signal from photoreceiver is obtained, and signal $$$ is recorded. Light flux coming to mirror is overlapped, and signal $$$ is recorded. Light flux coming to mirror is opened, linear polarizer is rotated till minimum signal from photoreceiver is obtained, and signal $$$ is recorded. Light flux coming to mirror is overlapped again, and signal $$$ is recorded. This done, linear polarization coefficient K is determined from expression: $$$. Device has illuminator, light filter and specimen holder positioned in succession along optical axis, as well as analyzer mounted for rotation and photoreceiver with indication and recording unit installed in direction of radiation reflected from specimen. Device also has first adjustable diaphragm, biconvex lens and second adjustable diaphragm installed in succession between light filter and specimen holder. Specimen holder is mounted for rotation about optical axis. EFFECT: more reliable determination of linear polarization coefficient. 2 cl, 4 dwg
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Authors
Dates
1998-04-20—Published
1995-09-04—Filed