METHOD OF DETERMINATION OF COEFFICIENT OF LIGHT LINEAR POLARIZATION IN REFLECTION AND DEVICE INTENDED FOR ITS REALIZATION Russian patent published in 1998 - IPC

Abstract RU 2109256 C1

FIELD: mining automatics. SUBSTANCE: parallel light flux is directed to mirror with polarization coating made of amorphous semiconductor. Light flux reflected from mirror is passed to photoreceiver through linear polarizer. The latter is rotated till maximum signal from photoreceiver is obtained, and signal $$$ is recorded. Light flux coming to mirror is overlapped, and signal $$$ is recorded. Light flux coming to mirror is opened, linear polarizer is rotated till minimum signal from photoreceiver is obtained, and signal $$$ is recorded. Light flux coming to mirror is overlapped again, and signal $$$ is recorded. This done, linear polarization coefficient K is determined from expression: $$$. Device has illuminator, light filter and specimen holder positioned in succession along optical axis, as well as analyzer mounted for rotation and photoreceiver with indication and recording unit installed in direction of radiation reflected from specimen. Device also has first adjustable diaphragm, biconvex lens and second adjustable diaphragm installed in succession between light filter and specimen holder. Specimen holder is mounted for rotation about optical axis. EFFECT: more reliable determination of linear polarization coefficient. 2 cl, 4 dwg

Similar patents RU2109256C1

Title Year Author Number
ELLIPSOMETRE 2008
  • Chikichev Sergej Il'Ich
  • Rykhlitskij Sergej Vladimirovich
  • Prokop'Ev Vitalij Jur'Evich
RU2384835C1
SPECTRAL ELLIPSOMETER 2003
  • Dulin S.A.
  • Rykhlitskij S.V.
RU2247969C1
ELLIPSOMETER 2005
  • Spesivtsev Evgenij Vasil'Evich
  • Rykhlitskij Sergej Vladimirovich
  • Shvets Vasilij Aleksandrovich
RU2302623C2
ELLIPSOMETER 0
  • Kovalev Vitalij Ivanovich
SU1695145A1
DEVICE FOR TESTING OF SEMICONDUCTOR MATERIALS 0
  • Gamarts Emelyan Mikhajlovich
  • Dernyatin Aleksandr Igorevich
  • Dobromyslov Petr Appolonovich
  • Krylov Vladimir Arkadevich
  • Kurnyaev Dmitrij Borisovich
  • Troshin Oleg Filippovich
SU1746264A1
METHOD OF MEASURING MAGNETOOPTICAL EFFECTS in situ 2014
  • Kosyrev Nikolaj Nikolaevich
  • Zabluda Vladimir Nikolaevich
  • Tarasov Ivan Anatol'Evich
  • Ljashchenko Sergej Aleksandrovich
  • Shevtsov Dmitrij Valentinovich
  • Varnakov Sergej Nikolaevich
  • Ovchinnikov Sergej Gennad'Evich
RU2560148C1
DEVICE FOR MEASUREMENT OF TOTAL DIFFERENCE OF PHASES OF LIGHT 1991
  • Starostenko B.V.
  • Nikitin V.V.
  • Erokhin S.A.
RU2014576C1
ELLIPSOMETER 2007
  • Spesivtsev Evgenij Vasil'Evich
  • Rykhlitskij Sergej Vladimirovich
  • Borisov Andrej Gennad'Evich
  • Shvets Vasilij Aleksandrovich
RU2351917C1
TRANSMITTED AND REFLECTED LIGHT MICROSCOPE 2009
  • Natarovskij Sergej Nikolaevich
  • Skobeleva Natalija Bogdanovna
  • Lobacheva Elena Viktorovna
  • Sokol'Skij Mikhail Naumovich
RU2419114C2
SPECTRAL ELLIPSOMETER 0
  • Kovalev V.I.
SU1369471A1

RU 2 109 256 C1

Authors

Gejkhman I.L.

Onishchenko A.M.

Fedorenko O.V.

Dates

1998-04-20Published

1995-09-04Filed