FIELD: physics.
SUBSTANCE: invention can be used for production of high-molecular compounds, as well as for prediction of polymers physical properties change under various operating conditions. Invention consists in that analysed material of thickness of d=(1÷3) mm serves placed in condenser primary measuring transducer so that analysed material is as dielectric layer. Primary transducer is connected to input of low-noise preamplifier. Ohmic multiplier Rd=(1÷100) kOhm is paralleled to primary transducer. Changing Rd value, at preset frequency v, maximum spectral density 
of electric fluctuation voltage, temperature T of polymeric system are evaluated, and dielectric characteristics being calculated from formulae.
EFFECT: extension of frequency range of dielectric polymer characterisation.
1 dwg
