FIELD: land surveying.
SUBSTANCE: invention is related to the field of land surveying, in particular, to devices for metrological gaging and calibration of land surveying instruments, for instance, leveling instruments and racks. Substance: test bench contains columns installed on foundation isolated from the floor, on which guide rails ate fixed with carriage installed on them with reference rod, and microscopes with micrometers installed above invar rod. Besides, large foundations are additionally installed in it with guide fixed on them with rotary mirror at the end, concrete base with tested instrument fixed on it, for instance, leveling instrument. At that microscopes are also installed with the possibility of displacement along the guide, and carriage is arranged with microdisplacement screw. Additionally, interferometer and unit of reference signal may be provided in the test bench, and corner reflector may be arranged on the carriage.
EFFECT: higher accuracy of measurements and possibility of simultaneous gaging and calibration of leveling instruments and racks.
2 cl, 1 dwg
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