WAY OF DETERMINATION OF SCINTILLATION DETECTOR PARAMETRES Russian patent published in 2009 - IPC G01T1/17 

FIELD: physics.

SUBSTANCE: invention concerns area of measuring technique, namely, to the control of scintillation detector parametres, and can be used for the control of the optical contact electrode between the scintillator and the photoelectronic multiplier in shielded devices for detection of an ionising radiation of radiating monitor type. The way of determination of scintillation parametres is based on the control of amplitudes of two detained target impulses of a photodetector from two corresponding light sources, first of them lights the photodetector photocathode. The second light source actuates luminescence of the scintillator which is mounted through an immersion layer on a substrate of the photodetector photocathode. Thus the radiation spectrum of the second light source is chosen below the lower border of a scintillator luminescence spectrum; thus the radiation spectrum of the first light source is chosen corresponding to effective length of scintillator luminescence. The first light source light output is thermostabilised taking into account temperature change of scintillator luminescence; thus the second light source light output is thermostabilised, compensating only its own temperature dependence of the light output, and the pair of impulses from a photodetector at presence of an immersion layer is supervised concerning pair impulses from a photodetector in absence of an immersion layer. Light sources are executed by the pulse semi-conductor.

EFFECT: quality monitoring of the optical contact electrode between the scintillator and the PI in various conditions of service during all longevity (at ageing and an operating time of the scintillator and a photomultiplier).

5 cl, 3 dwg