OBJECT INSPECTION METHOD (VERSIONS) AND SYSTEM Russian patent published in 2011 - IPC G01N23/02 

FIELD: physics.

SUBSTANCE: target object is selected and illuminated with a parallel beam of penetrating radiation which is transmitted from a source. Back-scattering radiation from the selected target object is picked up using a back-scatter detector lying relative the target object and covering the field of view seen from the selected target object at least 5 times greater than the field of view seen from the selected target object receiving from the source. Assumed reference values are obtained based on connection with parts of the selected target object. The back-scattered radiation factors are compared with the assumed reference values and the descriptive category, which characterises the selected target object, is determined based on the comparison.

EFFECT: ensuring better image quality, larger field of view for the given image quality, shorter scanning time for ensuring the given image quality and reduced dose received by the target for the given image quality.

18 cl, 24 dwg