FIELD: X-ray spectrometric quantitative analysis of element composition of substance for X-ray and fluorescent analysis of microsamples. SUBSTANCE: device for X-ray and fluorescent analysis incorporates source of primary X-ray radiation, mirror collimator in the form of wedge with reflecting internal surfaces, reflector in the form of logarithmic spiral, convex reflector in the form of transcendental curve, reflecting plate with sample mounted at angle of total external reflection with reference to formed beam and detector to raise sensitivity of it without increase of power of source thanks both to more complete concentration of radiation of formed beam on sample and to increase of input aperture. EFFECT: raised sensitivity of device. 1 dwg
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