METHOD AND APPARATUS FOR CALCULATING SIMILARITY METRIC BETWEEN FIRST FEATURE VECTOR AND SECOND FEATURE VECTOR Russian patent published in 2012 - IPC G06F17/30 

FIELD: information technology.

SUBSTANCE: method involves calculating distance between the first feature vector and the second feature vector, both the first feature vector and the second feature vector comprising a feature value of a second dimension, wherein a weight coefficient is used that gives higher weight to the first dimension than to the second dimension. The weight coefficient depends on features of the set of signals.

EFFECT: more accurate calculation of a similarity metric.

6 cl, 2 dwg