FIELD: electrical engineering.
SUBSTANCE: device contains a logical circuit, a local device for control of power supply and a self-calibration module designed so that to enable repetition of the logical circuit test within the integral microcircuit as accordingly lower power supply voltage values until the test yields a failure. The lowest power supply voltage value whereat the test is accomplished successfully is used for generation of the requested power supply voltage value for the integral microcircuit.
EFFECT: provision of correct operation of the integrated circuit.
14 cl, 13 dwg
