FIELD: electricity.
SUBSTANCE: in the method of detecting quantum dots located on a diagnosed sample, the sample is scanned in steps on XY coordinates using an electroconductive nano-sized needle with picosecond resolution and performing analysis of electrodynamic characteristics. Analysis is performed as follows: a semiconductor quantum dot is electrically exposed to a stimulating rectangular pulse; an analogue response signal is received and converted to a discrete signal; the information part of the response is picked up and identified with respect to a given class of dispersion of dynamic characteristics; coordinates XY are stored in memory and the topologies of the detected quantum dots with parameters included in given pre-start zones are displayed.
EFFECT: high reliability of detecting quantum dots.
2 cl, 3 dwg
