METHOD OF ANALYSING PHASE INFORMATION, DATA MEDIUM AND X-RAY IMAGING DEVICE Russian patent published in 2014 - IPC G01B11/25 G02B27/60 G21K7/00 

Abstract RU 2526892 C2

FIELD: physics.

SUBSTANCE: analysis method for obtaining phase information by analysing a periodic moire structure comprises steps of: subjecting a periodic moire structure to short-time Fourier transform using a window function; separating information on a first spectrum containing phase information from information on a second spectrum superimposed on information on the first spectrum to obtain phase information using an approximation of each of the forms of the first and second spectra to the form of a predefined function. The device comprises a diffraction grating for diffraction of X-rays from an X-ray source, an absorbing grid for screening part of the diffracted X-rays, a moire detector and a calculator which extracts a phase function based on the moire in accordance with the analysis method.

EFFECT: improved resolution when analysing phase information by eliminating spectrum overlapping.

12 cl, 15 dwg

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RU 2 526 892 C2

Authors

Nagai Kentaro

Dates

2014-08-27Published

2011-01-21Filed