FIELD: physics.
SUBSTANCE: system, consisting of two transparent samples or two transparent samples and a high-heat conductivity sample placed in between, where all samples are in the form of rectangular parallelepipeds with identical bases, with which the samples are brought into contact, is placed in an interferometer. The interferometer light beam is directed perpendicular to one of the lateral faces of each transparent sample. When generating fixed one-dimensional thermal flux in the system directed perpendicular to the contact plane, an interference method is used to measure change in the phase profile of the interferometer light beam passing through the transparent samples. Heat conduction of any of the contacts is calculated from the measured change in the phase profile of the interferometer light beam, the known heat conduction and geometric dimensions of the samples.
EFFECT: high reliability of obtained results.
1 dwg
