INTEGRAL CIRCUIT WITH PROGRAMMABLE LOGIC ANALYSER WITH EXPANDED ANALYSIS AND TUNING CAPABILITIES AND METHOD Russian patent published in 2016 - IPC G01R31/28 

FIELD: measurement equipment.

SUBSTANCE: invention relates to a built-in logic analyser and in particular, to a programmable built-in logic analyser for electronic circuit analysis. A device for testing and tuning of an electronic circuit, comprising a logic analyser, having the first inlet, accepting multiple signals, and an outlet for the provision of indication of detection, with the help of the logic analyser, of at least one triggering event; and a unit with built-in self-testing (BIST), having the first inlet for the acceptance of one or more signals, which are repeated on the first inlet of the logic analyser, the second inlet, connected to the outlet of the logic analyser for the selective engagement of the BIST unit, besides, the BIST unit generates and supports signature on the basis of the first and second inlets.

EFFECT: expansion of functional capabilities.

19 cl, 17 dwg