FIELD: electronics.
SUBSTANCE: invention relates to analysers of electronic circuits. Device comprises an integrated circuit, comprising a logic analyser circuitry having a first input receiving a plurality of signals, and a first output for providing selected samples of signals appearing at first input, and a first block having a first input coupled to logic analyser circuitry for receiving one or more of signals appearing at first input thereof and an output coupled to logic analyser circuitry for directly providing a distinct set of one or more signals, that are based upon one or more signals at first input of first block according to a predetermined function, predetermined function being configurable.
EFFECT: technical result is improvement of debugging capabilities and expansion of functional capabilities.
17 cl, 11 dwg
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Authors
Dates
2016-10-10—Published
2011-09-08—Filed