BACK-SCATTERING SYSTEM WITH VARIABLE SIZE MATRIX SENSORS Russian patent published in 2016 - IPC G01N23/203 

FIELD: physics.

SUBSTANCE: system of examination with back scattering with variable geometric characteristics contains matrix radiation sensors, including one or more sensors of scattered radiation. Position of second sensor scattered radiation is variable relative to first sensor-scattered radiation, so that size of sensor matrix can be changed by moving second radiation sensor in preset alignment position with first radiation sensor or position. System can contain movable base and at least one of sensors is configured to move relative to base. Methods of object examination include generating matrix sensors by moving second sensor radiation in preset alignment position with first radiation sensor, illuminating object with unidirectional beam of penetrating radiation and registration of scattered radiation using matrix sensors.

EFFECT: possibility of monitoring object on sufficient distance from system of examination.

19 cl, 17 dwg