METHOD FOR DETECTING STRUCTURAL DEFECTS IN CRYSTALLINE MATERIALS Russian patent published in 2017 - IPC G01N21/88 

Abstract RU 2615351 C2

FIELD: physics.

SUBSTANCE: sample is made in the implementation of the method for detecting the structural defects in the crystalline materials from the investigated crystalline material. Next, the sample is lighted, consisting of photons with energies within the range of 0.9 to 1.0 of the energy value equal to the forbidden zone width of the crystalline sample material. Contrast optical or photoelectric image of the structural defects is formed by the optical methods in the light past through the sample, and/or reflected and/or scattered by the sample material.

EFFECT: increasing contrast images of the structural defects.

2 cl, 4 dwg

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RU 2 615 351 C2

Authors

Grigorev Aleksandr Mikhajlovich

Dates

2017-04-04Published

2015-08-24Filed