METHOD OF ADJUSTING SAMPLES IN X-RAY DIFFRACTOMETER Russian patent published in 2017 - IPC G01N23/20 

FIELD: measuring equipment.

SUBSTANCE: calibration device is used, which is preset at the location of the sample holder with the possibility of micrometric displacements in the plane parallel to the equatorial goniometer plane. With the help of the linear displacement measuring instrument, the analytic dependence of the distance change is determined between the point on the calibration device surface and lying in the equatorial goniometer plane on the detector axis or the X-ray source by the selected fixed point, from the scan angle; the coordinates of the main goniometer axis are calculated from the resulted dependence, the calibration device axis is aligned with the main goniometer axis; the repeated measurements are made, the amplitude values are compared with the permissible values, and in case the values match the permissible values, the calibration device is removed, and the sample holder with the sample is installed. Considering the linear displacement meter readings, the sample plane is combined with the main goniometer axis by the sample holder shift along the axis parallel to the equatorial goniometer plane.

EFFECT: increasing the reproducibility of diffractometric measurements and the accuracy of sample alignment while reducing the time required to carry out these operations.

4 cl, 5 dwg