DEVICE OF ANALYZING TEST RESULTS FOR LOCALIZATION OF DOUBLE FAULTS Russian patent published in 2017 - IPC G01R31/00 G06F11/00 

FIELD: physics.

SUBSTANCE: device for analyzing test results for localization of double faults contains m m-bit multi-input signature analyzers (SA lines), the inputs of which are connected line by line with all the mm outputs of the tested object and m m-bit multi-input signature analyzers (SA columns), the inputs of which are connected on the columns with all mm outputs of the tested object. The device additionally contains m m-bit signature analyzers (SA diagonals), the inputs of which are connected diagonally with all mm outputs of the tested object.

EFFECT: increasing the frequency of faults when they are localized.

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