X-RAY DIFFRACTION METER Russian patent published in 2018 - IPC G01N23/20 

FIELD: measuring equipment.

SUBSTANCE: using for X-ray diffraction measurements. Essence of the Invention is in the fact that X-ray diffraction meter contains goniometer with a source of collimate X-ray radiation installed on its arc, whose beam axis passes through the center of circumference of the arc of goniometer, and a detector of diffracted radiation, as well as means for mutual movement of goniometer and an object under research, and a laser means generating radiation in visible range, to obtain information about position of center of the circle of the goniometer arc relative to selected study point on the surface of object under research. A feature of the diffractometer is that the laser means is made in the form of a laser distance meter whose light beam is oriented toward the center of the circumference of the goniometer arc.

EFFECT: simplify design of diffractometer and provide more freedom of layout by using only one laser tool, as well as providing more simplicity and accuracy of adjustment by reducing influence of subjective factor in its implementation.

11 cl, 2 dwg