FIELD: test technology.
SUBSTANCE: invention relates to the field of testing the parameters of a two-frequency non-linear vector network. Device includes a reference frequency module, selector switches, test ports, multiplier selection blocks, receivers, taps, a frequency mixer, a computing module, and consumers. Moreover, the selector switches include the first, second, third, fourth, fifth, sixth and seventh selector switches; test ports include first, second, and third test ports; the multiplier selection units include the first and second multiplier selection units for implementing the selection of transit signals, double, triple, and n multiplications; receivers include a receiver R to provide a phase reference for non-linear testing, a receiver R1 for testing the output signal of the first signal source, a receiver R2 for testing the output signal of the second signal source, receiver A for testing the signal entering the first test port, receiver B for testing the signal entering the second test port, and receiver C for testing the signal entering the third test port.
EFFECT: technical result consists in the possibility of predicting the nonlinear behavior of the components of microwave devices.
2 cl, 4 dwg
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Authors
Dates
2019-01-22—Published
2016-09-06—Filed