FIELD: measuring equipment.
SUBSTANCE: disclosed method of measuring object vibration parameters involves securing a test object on the object and recording a test object image with a vibration blur using a test pattern, wherein the pair parallel strokes of the group are located at a distance equal to twice the width of the stroke, and the width of the stroke decreases from a group of dashes with a low spatial frequency to a group of dashes with high spatial frequency. Video camera generates, on a computer screen, an image of the test pattern for each frequency of vertical scanning of the video camera to obtain a fixed image of the test pattern with vibration blur and fix the corresponding frequency of the frame scan of the video camera which is equal to the frequency of vibration of the object. Object is attached to an optoelectronic device connected to a computer which forms on its screen a test object in the form of test pattern from one group of parallel paired strokes perpendicular to the direction of vibration of the object. On the screen of the optoelectronic device, the test object is formed in the form of a dynamic image of a test pattern with low spatial frequency and amplitude-modulated by harmonic law value of brightness of a group of parallel pair strokes of the test pattern, then synchronized with subsequent fixation of phase change value of brightness of group of parallel paired strokes of test pattern and phase of oscillation of object, after which the brightness modulation depth of a group of parallel paired strokes of the test pattern is changed to obtain on the screen of a computer monitor a fixed image of a group of parallel paired strokes of the test pattern with vibration blurring and a minimum value of noise contrast, at which corresponding depth of brightness modulation of a group of parallel paired strokes of the test pattern is recorded, before recording in the fixed image of the test pattern with vibration blurring of the zero contrast in the group of strokes with the lowest spatial frequency to determine the vibration span of the object on the screen of the optoelectronic device, test objects are alternately formed, each of which is given a certain spatial frequency and is made in the form of dynamic images of the test pattern with amplitude-modulated by harmonic law values of brightness of a group of parallel pair strokes of the test pattern and previously fixed values of phase change of brightness of a group of parallel paired strokes of the test pattern and depth of modulation.
EFFECT: high accuracy of measuring vibration amplitude of an object.
1 cl, 3 dwg
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Authors
Dates
2020-02-03—Published
2019-05-13—Filed