METHOD OF SCANNING DILATOMETRY AND DILATOMETER FOR ITS IMPLEMENTATION Russian patent published in 2020 - IPC G01N25/16 G01B9/02 G01B11/16 

FIELD: measurement.

SUBSTANCE: group of inventions relates to measurements in the field of thermal expansion and is intended for precision measurements of temperature coefficient of linear expansion of solid-state products. One or two-wave Michelson interferometer scheme with variable phase is used for measurements, by means of which a set of speckle-interferograms of the analyzed surface of the article is formed. To reduce a random component of error, an artificial displacement of the phase of radiation reflected from the article is performed, which is performed by means of a device for positioning the angle radiation reflector from the article. Absolute variation of the article length is calculated proceeding from the number of cycles of variation of brightness of the selected speckles and its last value corresponding to a discrete-specified temperature.

EFFECT: technical result consists in providing the possibility of increasing measurement accuracy with simultaneous expansion of the range of measured samples and articles based on the roughness parameter of their surface.

4 cl, 6 dwg