FIELD: electronic technology.
SUBSTANCE: invention relates to electronic technology, in particular to methods designed to predict the emission durability of a metal-porous cathode (MPC) with an indirect glow during its operation as part of electro-vacuum products. The cathode under study is mounted in a chamber of the smallest possible size, to which a vacuum measuring device is connected, so that it is possible to supply the cathode heater head with incandescent power. A high vacuum is created in the chamber, and at a stable level of high vacuum, the pressure value is determined when the cathode is switched off. Then, when the pressure in the test chamber is continuously measured by applying a glow voltage to the cathode heater heads, the cathode is heated, and the maximum pressure value that is reached inside the chamber during cathode heating is recorded. The pressure values before and after switching of the cathode are compared. Next, the exposure is carried out in the switched-on state of the cathode. After carried out exposure of the cathode in the switched-on state, the glow voltage is turned off, the cathode cools down. After the cathode cools down and the temperature equilibrium is established inside the chamber, the pressure level inside the chamber with the cathode is re-recorded, and with continuous pressure measurement, the cathode is reheated and the maximum pressure level is re-determined during the cathode heating process. The glow voltage on the cathode heater head is switched off, the values measured before and after switching on the cathode are compared again. After holding the cathode in the switched-on state, the development of the process of cathode pore release from the active substance is predicted, that is, the evaporation of the active substance of the cathode over time, and consequently, the durability of the cathode.
EFFECT: invention increases the predicting accuracy of the cathode emission durability, including in the composition of products with metal walls that do not allow determining the temperature of the cathode during the test, which are to be installed in the finished equipment and operated during the expected service life.
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Authors
Dates
2021-08-18—Published
2020-10-19—Filed