DEVICE FOR TEMPERATURE AND VACUUM EXPOSURE Russian patent published in 2021 - IPC G01R31/28 G01N25/72 H01L35/28 

FIELD: testing and measuring equipment.

SUBSTANCE: invention relates to equipment for testing and measuring the technical characteristics of an electronic component base (ECB). The device for temperature and vacuum exposure for testing and measuring the technical characteristics of the electronic component of the base contains a carrier sealed platform with measuring channels wound inside through a sealed connector, ending with pogo pins that represent an interface for connecting the tested samples; a thermal group designed for heating and cooling the tested samples and containing a Peltier element and a contact surface that provides heat exchange between the Peltier element and the tested samples; an air cooling system designed to absorb heat generated by the Peltier elements as part of a heat collector, a water pump, an air-cooled flow radiator with fans and connecting hoses; a lifting hood with the possibility of opening, placing and connecting the test sample; a vacuum system consisting of a vacuum pump, a switching solenoid, an electronic vacuum meter and connecting tubes; electronic units for control, switching and communication with an external computer; power supplies and a PID controller; an external protective housing.

EFFECT: ensuring fast and reliable electrical contact of the device with the test sample, eliminating the possibility of short-circuiting the terminals of the tested samples at negative temperatures.

1 cl, 2 dwg