FIELD: computer technology.
SUBSTANCE: technical solution relates to the field of computer technology. The expected result is achieved due to the fact that the custom VLSI tester contains an external status monitoring port 1, an external network interface port 2, an external PCI_Express interface port 3, an external JTAG monitoring and control port 4, a reference frequency generator 5, a memory 6 of data and test results, a programmable exchange frequency generator 7, a control FPGA 8, memory 9 of the starting configuration, memory 10 of the working configuration, programmable VLSI operating frequency generator 11, status monitoring unit 12, the contacting device 13 with the VLSI cooling fan and radiator, the VLSI controlled power supply unit 14 and the VLSI power management unit 15.
EFFECT: expanding the testing functionality by checking custom VLSI at operating frequencies, as well as reducing the development and verification time of custom VLSI.
1 cl, 2 dwg
Title | Year | Author | Number |
---|---|---|---|
TESTER-VERIFIER | 2022 |
|
RU2795419C1 |
MULTIFUNCTIONAL DIAGNOSTIC SYSTEM | 2023 |
|
RU2815706C1 |
COMPUTING MODULE | 2018 |
|
RU2686004C1 |
AUTONOMOUS COMPUTING MODULE | 2019 |
|
RU2720556C1 |
AUTONOMOUS COMPUTING MODULE WITH SUBMODULES | 2020 |
|
RU2748299C1 |
COMPUTING MODULE WITH DYNAMIC REDISTRIBUTION OF COMPUTING RESOURCES | 2023 |
|
RU2823113C1 |
RECONFIGURABLE COMPUTING SYSTEM | 2017 |
|
RU2677363C1 |
COMPUTING MODULE FOR MULTITASKING COMPUTING SYSTEMS | 2021 |
|
RU2780169C1 |
RECONFIGURABLE COMPUTING SYSTEM | 2019 |
|
RU2713757C1 |
SYSTEM FOR FUNCTIONING TESTS AND BURN-IN TESTING OF DIGITAL INTEGRATED CIRCUITS (IC) AND VERY LARGE SCALE INTEGRATED CIRCUITS (VLSIC) | 2011 |
|
RU2485529C1 |
Authors
Dates
2022-08-04—Published
2021-11-29—Filed