FIELD: computer engineering.
SUBSTANCE: invention relates to computer engineering, in particular to automatic testing devices and can be used for testing custom VLSI at operating frequencies and verification of their designs on PLD during development. Multifunctional diagnostic system comprises a control computer with control consoles, a PCI_ Express port switch, a network ports switch, an external user network port, a JTAG control and monitoring port switch, a monitoring port switch and a group of K test modules. Each of the test modules comprises a manual control console, state display unit, reference frequency generator, test program non-volatile memory connection port, control PLD configuration control unit, configuration memory unit, non-volatile memory controller of test programs, non-volatile memory of test parameters setting subprograms, data and test results memory, temperature mode stabilization control unit and cooling fan rotation speed control unit, power control unit, programmable operating frequency generator, programmable exchange frequency generator, condition monitoring unit, unit of controlled power supplies, contacting device with fan and cooling radiator, unit of integrated logic analyser of state and control PLD. Control PLD comprises a logic analyser unit, a signature analyser unit and a hardware test action generation unit implemented on the control PLD resources.
EFFECT: broader functional capabilities of testing and high reliability of control when testing custom VLSI.
1 cl, 1 dwg
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Authors
Dates
2024-03-20—Published
2023-10-23—Filed