SYSTEM FOR FUNCTIONING TESTS AND BURN-IN TESTING OF DIGITAL INTEGRATED CIRCUITS (IC) AND VERY LARGE SCALE INTEGRATED CIRCUITS (VLSIC) Russian patent published in 2013 - IPC G01R31/00 

FIELD: testing equipment.

SUBSTANCE: device comprises an instrument rack for placement of testing equipment; a tester for realisation of control over main parameters of tested IC and VLSIC and functioning control; a network concentrator; a DC source; an industrial computer; an uninterrupted power supply source; an Ethernet network; a heat chamber; control and measurement equipment, comprising a printed circuit board and contacting devices for tested IC and VLSIC. At the same time the first output of the uninterrupted power supply source is connected with the input of the network concentrator, the second output is connected with the input of the DC source, the third output is connected with the input of the industrial computer, the input-output of the industrial computer is connected with the first input-output of the network concentrator, the second input-output of which is connected with the first inputs and outputs of testers, the second inputs-outputs of testers are connected with inputs and outputs of printed circuit boards of control and measurement equipment, contacting devices are fixed on a printed circuit board with the help of soldering, inputs of testers are connected with the output of the DC source.

EFFECT: improved quality of testing, possibility to do tests after crystal encapsulation, increased number of channels, increased control over testing.

2 dwg