METHOD FOR DETERMINING THE RESISTANCE OF STRUCTURAL ELEMENTS OR RADIO-ELECTRONIC EQUIPMENT OF LOW-ORBIT SPACECRAFT TO THE INFLUENCE OF SPACE FACTORS AND A DEVICE FOR ITS IMPLEMENTATION Russian patent published in 2023 - IPC G01R31/305 

FIELD: space industry.

SUBSTANCE: the invention relates to test equipment and may be used in ground tests of structural elements (SE), materials and coatings, as well as radio-electronic equipment (REE) under the influence of space factors (SF) on the low-orbit spacecrafts (LOSC). The essence of the claimed method is as follows. The test sample (TS) is placed inside a vacuum chamber that has been vacuumed with the control of the vacuum value, the required characteristics of the emitted electron gun beam are set on the control stand of the electron flow simulator (EFS), irradiated with a TS electron flow. In the case when the TS is a structural element, it is installed on a TS rack; in the case when the TS is a REE, it is installed on a positioning device; for each of the cases the equipment is grounded through the vacuum chamber pressure plate, then a system for measuring output parameters is connected to the TS, after closing the vacuum chamber the radiation protection is installed that covers the flanged joints of the sections of the vacuum chamber with screens and casings, when the TS is under vacuum, using the focusing system of the EFS, the current and diameter of the electron flux beam are set on the TS, EFS is turned on in the “spotlight” mode, irradiating the TS completely, and in the “scanning” mode, when irradiation occurs at a frequency set by the operator. The sequence of irradiation of the TS is determined depending on the TS, while at each stage of irradiation the output parameters of the TS are recorded at a voltage from 5 kV to 50 kV with an N step, using a system for measuring the output parameters of the TS. Next, the TS is rotated relative to the EFS from 0 to 270 degrees, depending on the TS, and the above stages of irradiation of the TS are repeated with fixation of the output parameters of the TS. The essence of the claimed device is achieved due to the fact that the SF PM Stand consists of a vacuum chamber with an automated pumping system with a vacuum monitoring and measurement function; EFS, consisting of a control rack of an electron flow simulator and an electron gun, which allows continuous irradiation of an TS located inside the useful volume of the vacuum chamber with an electron flow, a turntable inside the vacuum chamber, on which, depending on the design features and type of the test object, an equipment grounded through the vacuum chamber hermoplate is installed in the form of an TS rack or a positioning device the stand is also equipped with a system for measuring the output parameters of the TS, a fluorescent screen for monitoring the position of the projection of the electron beam, and to protect the working personnel from ionizing radiation, radiation protection is used, consisting of screens and casings covering the flanged joints of the vacuum chamber.

EFFECT: development of a method for determining the real parameters of electrification of SE, materials and coatings, and assessing the efficiency of REE under the conditions of exposure to the above-mentioned SF.

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