METHOD FOR DETERMINING LOCATION AND NATURE OF DEFECT IN ELECTRONIC COMPONENTS Russian patent published in 2023 - IPC G01R31/28 

FIELD: control; measuring equipment.

SUBSTANCE: invention can be used to determine the location and nature of the defect in inoperative electronic components. Essence: initially a reference copy of the electronic unit being tested is created based on a circuit model. Then the electronic component being tested is exposed to a test signal. The response of the electronic unit being tested is registered and compared with the standard. The current-voltage characteristics obtained at pairs of test signal supply points of the electronic unit being tested are used as responses. The same effects and measurement of current-voltage characteristics are carried out on the reference copy. The resulting current-voltage characteristics of the electronic unit being tested and the reference model are normalized. Received characteristics are formed into a matrix of values and projected into the n -dimensional space of principal components, transforming into points. To localize a defect, the distance between points of the same name in the space of principal components is determined.

EFFECT: expanding the scope of application.

1 cl, 7 dwg