METHOD OF DETERMINING INTEGRAL AND DIFFERENTIAL NONLINEARITIES OF ADC AND DEVICE FOR ITS IMPLEMENTATION Russian patent published in 2024 - IPC H03M1/10 

FIELD: measuring; computer engineering.

SUBSTANCE: invention relates to measurement and computer engineering, namely to metrological tests of analogue-to-digital converters (ADC). Device for determining integral and differential nonlinearities of an ADC comprises a measuring signal (MS) generator, a MS displacement signal source, a MS displacement circuit, a microcontroller and a computer. First input of the MS displacement circuit is connected to the output of the MS generator, and the second input of the MS displacement circuit is connected to the output of the MS displacement signal source. Control inputs of the MS generator and the MS displacement signal source are connected to the first and second outputs of the microcontroller. Output of the MS displacement circuit is connected to the input of the tested ADC, the output of which is connected to the input of the microcontroller, the third output of which is connected through an interface to the computer.

EFFECT: possibility of determining integral and differential nonlinearities of an analogue-to-digital converter (ADC), reducing requirements for reference measuring instruments as to accuracy class by taking into account the nonlinear component of the measuring signal (MS).

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