FIELD: technological physics. SUBSTANCE: values of changes in path-length difference is detected in monochromatic light when plate under testing rotates. Moreover, path-length difference is measured for standard plate, rotating in monochromatic light, as well as, values of changes in path-length difference is measured in white light, when the plate under test is rearranged in the arms of white light interferometer. EFFECT: improved precision of measurement under conditions, when width of the plates is not known before. 3 dwg
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Authors
Dates
1994-05-30—Published
1989-03-13—Filed