METHOD FOR MEASURING RERADIATING LAYER THICKNESS ON LIGHT CONDUCTOR-SPECTRUM MIXER SURFACE Russian patent published in 1994 - IPC

Abstract SU 1767959 A1

FIELD: light conductor optics. SUBSTANCE: fluorescent light excited by electron flow is clearly exposed with bright contract in respect to uncolored polymer. Layer thickness is measured by subsequent scanning of image on microphotometers. EFFECT: improved measurement accuracy and economic efficiency due to photorecording of fluorescent layer.

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SU 1 767 959 A1

Authors

Datsko V.S.

Dates

1994-07-15Published

1990-08-30Filed