FIELD: vacuum electronics. SUBSTANCE: method involves measuring flicker noise of current, that is lost by cathode for two values of this current. Ratio of measured levels of noises depends on cathode emission current. This ratio is increased when emission is decreased. Criterion for fault detection of devices having low level of emission is comparison of measured noise value ratio to reference one. Reference ratio is determined for minimal possible emission current, and device are judged as fault if their measured ratio is greater than reference one. EFFECT: increased functional capabilities. 4 dwg, 1 tbl
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