METHOD FOR CONTROLLING RADIATION PARAMETERS OF SEMICONDUCTOR MATERIALS Russian patent published in 1995 - IPC

Abstract SU 1831967 A3

FIELD: optoelectronics. SUBSTANCE: in order to improve parameters of infrared radiation with adjustable working wavelength, use is made of semiconductor material possessing inherent conductance and positive or negative barometric coefficient of forbidden region width which is compressed on all sides within pressures P between atmospheric value and pressure equal to 2kT/q1n , where λo is radiation wavelength of uncompressed semiconductor, Nc,Nv is density of states in conductance zone and in valence zone, respectively; q is barometric coefficient of forbidden zone width; Nadmixtures is concentration of admixtures; K is Boltzmann constant; T is temperature; h is Planck constant; c light speed. When mentioned semiconductor InSb is used, radiation spectrum stepless control range is 6.9-3.5 mcm. EFFECT: enlarged stepless control range of positive and negative contrast radiation spectrum parameters with maximum efficiency of positive contrast radiation output. 4 dwg

Similar patents SU1831967A3

Title Year Author Number
ELECTROMAGNETIC RADIATION SOURCE 0
  • Bolgov Sergej Semenovich
  • Malyutenko Vladimir Konstantinovich
  • Yablonovskij Evgenij Ivanovich
SU1117736A2
ELECTROMAGNETIC RADIATION SOURCE 0
  • Bolgov Sergej Semenovich
  • Malyutenko Vladimir Konstantinovich
  • Pipa Viktor Iosifovich
SU1023676A1
TEMPERATURE PICKUP 0
  • Bolgov Sergej Semenovich
  • Vajnberg Viktor Vladimirovich
  • Zarubin Leonid Iosifovich
  • Malyutenko Vladimir Konstantinovich
  • Yablonovskij Evgenij Ivanovich
SU1195197A1
METHOD OF MEASURING HYDROSTATIC PRESSURE 0
  • Malyutenko Vladimir Konstantinovich
  • Guga Konstantin Yurevich
  • Kislyj Vladimir Pavlovich
SU1516810A1
INFRARED SEMICONDUCTOR RADIATOR 1991
  • Bolgov Sergej Semenovich[Ua]
  • Jablonovskij Evgenij Ivanovich[Ua]
  • Saljuk Ol'Ga Jur'Evna[Ua]
  • Konstantinov Vjacheslav Mikhajlovich[Ru]
  • Igumenov Valerij Timofeevich[Ru]
  • Morozov Vladimir Alekseevich[Ru]
RU2025833C1
SEMICONDUCTOR DIODE FOR IR SPECTRAL RANGE 2002
  • Matveev Boris Anatol'Evich
RU2286618C2
SURFACE RECOMBINATION RATE MEASURING METHOD 0
  • Malyutenko Vladimir Konstantinovich
  • Pipa Viktor Iosifovich
  • Bolgov Sergej Semenovich
  • Chajkin Vladimir Ivanovich
SU794566A1
SEMICONDUCTOR SOURCE OF INFRARED RADIATION 2001
  • Matveev B.A.
RU2261501C2
0
  • Abutalybov Gadzhibala Ibragim Ogly
  • Larionkina Liliya Sergeevna
  • Ragimova Nailya Ali Kyzy
  • Rasulov Arif Gakhraman Ogly
SU1778578A1
METHOD OF DETERMINING THE ENERGY LEVEL POSITION OF FLAW AND IMPURITY CENTRES IN SEMICONDUCTOR AND DIELECTRIC MATERIALS 0
  • Gorban Ivan Stepanovich
  • Odulov Sergej Georgievich
  • Olejnik Olga Ivanovna
  • Soskin Marat Samuilovich
SU1330676A1

SU 1 831 967 A3

Authors

Maljutenko V.K.

Guga K.Ju.

Kislyj V.P.

Dates

1995-08-09Published

1989-01-25Filed