METHOD OF TESTING PARAMETERS OF SEMICONDUCTOR MATERIALS Russian patent published in 1994 - IPC

Abstract RU 2025827 C1

FIELD: nondestructive material testing. SUBSTANCE: dependence of current of jump conductance on temperature of sample is found. Sample is exposed to ionization radiation generating electron-hole pairs with subsequent determination of dependence of relaxation of current of jump conductance on time under constant temperature and quasi-equilibrium conditions. Value of energy of activation of jump conductance, degree of compensation and concentration of traps are found by calculation with the aid of obtained dependences. EFFECT: reduced time and improved authenticity of testing. 2 cl, 1 dwg

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RU 2 025 827 C1

Authors

Zaitov F.A.

Gorshkova O.V.

Zykov V.M.

Volkov V.F.

Kiselev A.N.

Dates

1994-12-30Published

1990-10-08Filed