FIELD: measurement equipment.
SUBSTANCE: with an appropriate start preparation of samples and selection of a registration frequency, based on information about frequency spectra, key parameters of impurity elements in crystals of sillenites may be determined.
EFFECT: possibility to evaluate the parameters, which characterise optoelectronic properties of sillenites, by results of measurements of frequency dependencies of conductivity, complex dielectric permeability and tangent of the angle of dielectric losses under various temperatures.
4 dwg
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