METHOD OF X-RAY STRUCTURAL STUDY OF INITIAL RECRYSTALLIZATION Russian patent published in 1995 - IPC

FIELD: X-ray structural analysis. SUBSTANCE: examined samples are subjected to treatment by pressure. Then samples deformed plastically are isochronically annealed and roentgenographic pictures are taken. Diffraction picture obtained as a result of roentgenography is interpreted in compliance with detected regularities between treatment modes and length of wave of X-ray radiation, on the one hand, and characteristics of grain structure, on the other hand. As distinct from metallographic method this one is nondestructive, can be applied to fine-grained alloys after modification, brings in more information. It enables parameters of initial recrystallization to be determined with higher precision, its kinetics to be analyzed over thickness 0.1-100.0 μm of surface layer of object. EFFECT: method generates much more information on parameters of initial recrystallization.