PROCESS DETERMINING CRITICAL LEVEL OF PLASTIC DEFORMATION IN METAL ALLOYS Russian patent published in 1999 - IPC

Abstract RU 2133027 C1

FIELD: X-ray structural analysis and control over thermal treatment of alloys after plastic deformation. SUBSTANCE: tested objects are subjected to plastic metal working starting from subcritical to high levels of transcritical deformation. Deformed and annealed samples are subjected to radiography with scintillation registration of diffraction pattern together with grain nonoriented standard. Diffraction lines by relation of which intensities real value of critical level of plastic deformation is found are determined on basis of analysis of results of radiography. As distinct from metallographic method given process is nondestructive and in comparison with X-ray method of photoregistration of diffraction picture it is more accurate and requires less labor input. EFFECT: improved functional accuracy of process. 2 cl, 5 dwg

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RU 2 133 027 C1

Authors

Kolerov O.K.

Grechnikov F.V.

Logvinov A.N.

Aryshenskij V.Ju.

Dates

1999-07-10Published

1997-07-29Filed