FIELD: X-ray structural analysis and control over thermal treatment of alloys after plastic deformation. SUBSTANCE: tested objects are subjected to plastic metal working starting from subcritical to high levels of transcritical deformation. Deformed and annealed samples are subjected to radiography with scintillation registration of diffraction pattern together with grain nonoriented standard. Diffraction lines by relation of which intensities real value of critical level of plastic deformation is found are determined on basis of analysis of results of radiography. As distinct from metallographic method given process is nondestructive and in comparison with X-ray method of photoregistration of diffraction picture it is more accurate and requires less labor input. EFFECT: improved functional accuracy of process. 2 cl, 5 dwg
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Authors
Dates
1999-07-10—Published
1997-07-29—Filed