DEVICE FOR MEASUREMENT OF COMPLEX REFLECTION FACTOR IN QUASI-OPTICAL SECTIONS Russian patent published in 1997 - IPC

FIELD: radiometering equipment, can be used for measuring the parameters of materials in centimetric, millimetric and submillimetric wave bands. SUBSTANCE: quasi-optical section based on metallodielectric waveguides uses a microwave oscillator, directional coupler, operating mode transducers in the form of a smooth pyramidal horn with two metal plates adjoining the larger base and positioned in parallel with the axis, having a galvanic contact with the wider walls of the horn, four-arm rectangular branching of square waveguides with a directional power divider in the form of a dielectric plate shifted relative to the diagonal plane. The microwave oscillator is connected to the first arm of the waveguide branching via the directional coupler and first operating mode transducer; the second branching arm, opposite the first one, is furnished with appliances for connection of the specimen to be measured. The third lateral arm, adjacent to the first one and arranged on one side of the directional power divider, is connected to the first matched load, and the fourth arm, via the second operating mode transducer, is connected to the first detector section, whose output is connected to the first input of the indicator unit, connected to its second input is the output of the second detector section, whose input is connected to the output of the secondary waveguide of the directional coupler. The device variant is intended for polarization measurements, the design of individual units and the results of measurements are also given. EFFECT: minimized contribution of interference factors for provision of measurement of very low (50 to 60 dB) reflection factors. 9 cl, 7 dwg