FIELD: physics of solid body, optical spectrophotometry, selection of substrates for growing of epitaxial films of ferrite-garnets used in optoelectronics working under conditions of ionizing radiation. SUBSTANCE: optical method of quality inspection of crystals with structure of garnets consists in recording of transmission spectra of lot of plates-substrates based on gallium garnets in range 36000-38000 cm-1. Their unfitness for growing of epitaxial ferrite-garnet films working in fields of ionizing radiation is evaluated by presence of absorption band in range 35500-25000 cm-1 with maximum at 29000 cm-1 in transmission spectrum. EFFECT: enhanced efficiency of method. 3 dwg
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