FIELD: solid-state physics; spectrophotometry. SUBSTANCE: method that may be found useful in selecting single crystals and epitaxial films of garnet-type ferrites includes recording of specimen reflection spectra in wavelength range λ = (0,45-0,65) mcm; presence of band with λ = 0,555 in reflection spectra serves as indication of their unsuitability for manufacturing microwave and magneto-optic devices that require narrow width of ferromagnetic resonance line and minimal optical absorption. Such band may be also used for coarse evaluation of Pb ion concentration in specimens. Proposed method provides for producing high- quality microwave and magneto-optic devices and for evaluating lead ion concentration in garnet-type ferrites used for their manufacture. EFFECT: improved reliability of quality control. 3 cl, 5 ex
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