FIELD: examination and analysis of materials. SUBSTANCE: radiation flux is subjected to space modulation by introduction of local shadings. After passing through object, angles of flux ray deflection relative to direction of rays before entering the object are checked, and these angular deflections are transformed to projection contrast by measuring the space modulation transfer transversely to radiation flux. Device has penetrating radiation source 1, modulator 3 producing the space transverse nonuniformities in it, facility for transformation of angular deflections of radiation passed through object 4 to contrast of projection 8 of object 4, and element 5 for measuring of transverse transfer of space nonuniformities. EFFECT: higher efficiency. 17 cl, 9 dwg
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Authors
Dates
1997-12-10—Published
1994-11-30—Filed